TY - GEN
T1 - Multi-state degradation analysis for a condition monitored device with unobservable states
AU - Moghaddass, Ramin
AU - Zuo, Ming J.
PY - 2012/9/28
Y1 - 2012/9/28
N2 - The degradation process associated with a mechanical device can be represented by a discrete type of multi-state degradation model. Each discrete state in a multi-state degradation model corresponds to a certain health status of the device. In this paper, a general type of multi-state degradation model is considered for a device for which the health states are not directly observable and instead, indirect information is available through condition monitoring. We first demonstrate how nonhomogeneous continuous-time hidden semi-Markov process can be used to model a multi-state degradation process and then briefly review an unsupervised estimation procedure, which can be used to estimate the unknown characteristics of the stochastic processes associated with the degradation process and the observation process of a multi-state device. A simple numerical example is provided to demonstrate the application of the presented model.
AB - The degradation process associated with a mechanical device can be represented by a discrete type of multi-state degradation model. Each discrete state in a multi-state degradation model corresponds to a certain health status of the device. In this paper, a general type of multi-state degradation model is considered for a device for which the health states are not directly observable and instead, indirect information is available through condition monitoring. We first demonstrate how nonhomogeneous continuous-time hidden semi-Markov process can be used to model a multi-state degradation process and then briefly review an unsupervised estimation procedure, which can be used to estimate the unknown characteristics of the stochastic processes associated with the degradation process and the observation process of a multi-state device. A simple numerical example is provided to demonstrate the application of the presented model.
KW - Condition Monitoring
KW - multi-state degradation
KW - semi-Markov process
KW - unsupervised estimation
UR - http://www.scopus.com/inward/record.url?scp=84866596757&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84866596757&partnerID=8YFLogxK
U2 - 10.1109/ICQR2MSE.2012.6246295
DO - 10.1109/ICQR2MSE.2012.6246295
M3 - Conference contribution
AN - SCOPUS:84866596757
SN - 9781467307888
T3 - Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012
SP - 549
EP - 554
BT - Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012
T2 - 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012
Y2 - 15 June 2012 through 18 June 2012
ER -